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Structural Analysis Equipment - List of Manufacturers, Suppliers, Companies and Products

Structural Analysis Equipment Product List

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X-ray CT internal structure analysis and cross-sectional tissue observation

Precision surface finishing with pinpoint accuracy! Internal structures can be understood in three dimensions using X-ray CT.

Our company conducts internal structure analysis and cross-sectional tissue observation using X-ray CT. Corrosion of metal materials exhibits complex three-dimensional shapes, making it difficult to identify important starting points for determining the cause, and there has been a demand for a quick and appropriate method for selecting analysis locations. With the newly introduced X-ray CT, internal structures can be understood in three dimensions, and through skilled techniques, precise surface finishing can be achieved at pinpoint locations, allowing for rapid detailed analysis of optimal areas. 【Details】 ■Visual inspection ■X-ray CT measurement ■Cross-sectional tissue observation *For more information, please refer to the PDF document or feel free to contact us.

  • Company:KRI
  • Price:Other
  • X-ray inspection equipment

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[Analysis Case] Evaluation of Liquid Crystal Structure and Micelle Size of Emulsifiers by SAXS

Capable of structural analysis at the nanoscale and evaluation of nanoparticle size.

Emulsification technology is a fundamental technology in cosmetic development and is utilized across various cosmetics. Changes in the structure of emulsifiers are closely related to the balance of water and oil in the product, the permeability of encapsulated active ingredients, cleansing power, and changes in user experience, making its analysis very important.

  • Contract Analysis

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[Analysis Case] Identification of the Crystal Structure and Calculation of the Composition Ratio of HfZrOx Film

More detailed evaluation is possible through combined analysis using XRD and XAFS.

The HfZrOx film, which is attracting attention as a high-k material and ferroelectric, has its physical properties such as dielectric constant significantly affected by its crystal structure. Therefore, identifying the crystal structure and calculating the proportion of each crystal structure are important evaluation criteria. While these can typically be assessed using XRD and XAFS, combining these two methods can provide more detailed information, even in cases where detailed analysis is difficult with just one method. In this instance, we present a case of identifying the crystal structure of HfZrOx films and calculating the proportions of each crystal structure through combined analysis of XRD and XAFS.

  • Contract Analysis

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